发明名称 Verfahren zur Herstellung einer Halbleitervorrichtung mit einer Verdrahtungsstruktur hoher Dichte
摘要 A semiconductor device with a high-density wiring structure, and a producing method for such device are provided. The semiconductor device has a substrate such as silicon, an insulation layer laminated on the substrate and having a groove or a hole, and a wiring of a conductive material formed in the groove or hole in the insulation layer. The wiring is formed by depositing a conductive material such as aluminum or an aluminum alloy in the groove or hole of the insulation layer by a CVD method utilizing alkylaluminum hydride gas and hydrogen. The groove or hole can be formed by an ordinary patterning method combined with etching. <IMAGE>
申请公布号 DE69125210(T2) 申请公布日期 1997.08.07
申请号 DE1991625210 申请日期 1991.05.29
申请人 CANON K.K., TOKIO/TOKYO, JP 发明人 MUROOKA, FUMIO;ASABA, TETSUO;MATSUMOTO, SHIGEYUKI;IKEDA, OSAMU;ICHISE, TOSHIHIKO;SAKASHITA, YUKIHIKO, CANON KABUSHIKI KAISHA, OHTA-;INOUE, SHUNSUKE
分类号 H01L21/00;H01L21/285;H01L21/677;H01L21/768;H01L23/522;(IPC1-7):H01L21/285 主分类号 H01L21/00
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