Distance determining method between single crystal test objects and flat X-ray detection devices

摘要

The method involves irradiating the surface of the test object perpendicularly with a primary X-ray beam. The secondary X-rays diffracted by the object are detected by the detection device. The distance between the primary and secondary beams in the plane of the detection device is determined for secondary X-ray beams diffracted at different families of crystal structure main planes. After this the angle between the primary and secondary X-rays is determined for the different secondary X-ray beams and used to derive the distance between the test object and detection device.