发明名称 Apparatus for testing printed circuit boards
摘要 A testing apparatus is disclosed as including an isolation test probe adapted to effect an isolation test on a circuit board, and a continuity test device adapted to then effect a continuity test on the circuit board. The continuity test device includes the isolation test probe and two continuity testing members which are movable sequentially.
申请公布号 US5654646(A) 申请公布日期 1997.08.05
申请号 US19950451181 申请日期 1995.05.26
申请人 CENTALIC TECHNOLOGY DEVELOPMENT LTD. 发明人 KIT, KWOK SUI
分类号 G01R1/073;G01R31/28;(IPC1-7):G01R15/12 主分类号 G01R1/073
代理机构 代理人
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