发明名称 |
Apparatus for testing printed circuit boards |
摘要 |
A testing apparatus is disclosed as including an isolation test probe adapted to effect an isolation test on a circuit board, and a continuity test device adapted to then effect a continuity test on the circuit board. The continuity test device includes the isolation test probe and two continuity testing members which are movable sequentially.
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申请公布号 |
US5654646(A) |
申请公布日期 |
1997.08.05 |
申请号 |
US19950451181 |
申请日期 |
1995.05.26 |
申请人 |
CENTALIC TECHNOLOGY DEVELOPMENT LTD. |
发明人 |
KIT, KWOK SUI |
分类号 |
G01R1/073;G01R31/28;(IPC1-7):G01R15/12 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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