发明名称 TEMPORARY SEMICONDUCTOR PACKAGE INCLUDING HIGH DENSITY ARRAY EXTERNAL CONTACT
摘要 PROBLEM TO BE SOLVED: To obtain a temporal package including an external contact having a standard external appearance and high density by providing a base for fixing a die to a base surface of a high density array and an electrical path formed between a contact member on an inter-connector and an external contact on the base. SOLUTION: A package 10 includes a package base 14, an inter-connect 16, and a pressurization mechanism 18. The inter-connect electrically communicates with a package base 14 and a die. The package 14 has a pattern of an internal conductive member 40, and electrically communicates with an external contact formed on a bottom surface of the package base 14. The package 10 holds a semiconductor die and is temporarily electrically connected with the die for testing and burning-in. After the testing, the die is removed from the package 10 and is used as a die passing the test.
申请公布号 JPH09199621(A) 申请公布日期 1997.07.31
申请号 JP19960113885 申请日期 1996.05.08
申请人 MICRON TECHNOL INC 发明人 DEIBUITSUDO AARU HENBURII;UOOREN EMU FUAANWAASU;ARAN JII UTSUDO;SARUMAN AKURAMU
分类号 G01R31/26;H01L21/66;H01L23/00;H01L23/50;(IPC1-7):H01L23/00 主分类号 G01R31/26
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