发明名称 THIN FILM THERMISTOR MANUFACTURE METHOD
摘要 PROBLEM TO BE SOLVED: To manufacture a small and low resistance thermistor device satisfying contradicting conditions, one is that the B constant is increased and the other is that the conductivity is increased. SOLUTION: The thermistor device is manufacture by plasma CVD method. As material gas, a gas mixture of mono-silane and methane gas which is diluted by hydrogen has is used. Diborane is used as dopant gas. The flow rate of the dopant gas to the material gas is not less than 1% and that of the hydrogen gas to the material gas is not more than 4. The discharge power density is not less than 110mW/cm<2> when the plasma CVD method is conducted. The flow rate of the material gas is 40 to 60 sccm. If the thermistor device is manufactured under these conditions, it is possible for the thermistor device to have a higher coefficient (σ0 ) and have higher conductivity while preventing the B constant from decreasing.
申请公布号 JPH09199304(A) 申请公布日期 1997.07.31
申请号 JP19960007837 申请日期 1996.01.19
申请人 MATSUSHITA ELECTRIC WORKS LTD 发明人 ICHIHARA TSUTOMU;AIZAWA KOICHI
分类号 H01C7/02;H01C7/04;H01L21/205;(IPC1-7):H01C7/02 主分类号 H01C7/02
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