发明名称 METHOD FOR OBSERVING BUMP
摘要 PROBLEM TO BE SOLVED: To provide a method for clearly observing a bump of a chip which is bonded to a glass substrate with an ACF(anisotropic Conductive tape) therebetween without being disturbed by bubbles in the ACF. SOLUTION: Lights are irradiating a glass substrate 11 to which a chip 12 is bonded from a first diagonal direction light source B and a second diagonal direction light source C. Two bright and dark images are obtained by using a camera 32. In each of the two bright and dark images, a portion of a bubble in an ACF looks partly shinning. However, the locations of the portions in the respective images are different from each other. Therefore, the two bright and dark images are synthesized to form an AND image, then the bubbles are quenched so that only a bump for aligning the position is brightly observed.
申请公布号 JPH09196617(A) 申请公布日期 1997.07.31
申请号 JP19960007075 申请日期 1996.01.19
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ISHIKAWA TAKATOSHI
分类号 G01B11/00;H01L21/60;H01L21/66;(IPC1-7):G01B11/00 主分类号 G01B11/00
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