发明名称 METHOD FOR CORRECTING PROPAGATION DELAY TIME OF IC TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce the labor of operator when replacing a DIF(Device Interface) and at the same time, reduce the time required for correcting the amount of delay of a delay circuit. SOLUTION: A control part 6 calculates the amount of compensation delayΔτaj andΔτbj (j=1 to n) of delay circuits DLaj and DLbj under measurement conditions set to a measurement condition memory M1 from data CL (DIF- NO.1)-CL(DIF-NO.m) of a DIF cable length memory M2 and stores it in a memory M3 for the amount of correction delay as data filesτ(DIF-NO.1)-τ(DIF-NO. m) in advance. Also, the control part 6 reads the ID number (for example, N0.2 and N0.4) of the DIF 3a and 3b to be used this time and registers it in a RAM and at the same time, extracts a file for the amount of correction delay corresponding to the ID number and controls the amount of delay of a delay circuit.
申请公布号 JPH09197010(A) 申请公布日期 1997.07.31
申请号 JP19960004893 申请日期 1996.01.16
申请人 ADVANTEST CORP 发明人 KANAI JUNICHI
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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