发明名称 METHOD AND APPARATUS FOR MEASURING SURFACE NATURE
摘要 PROBLEM TO BE SOLVED: To automatically estimate a nature of an internal face of a duct or the like with an apparatus for measuring surface nature inserted into the duct by applying shed light to a surface of an object to be measured and receiving and detecting the reflected light. SOLUTION: A semiconductor laser 1 outputs a certain amount of light by a drive circuit 2. Light L2 reflected on a measured surfaceα1 is detected by a two-dimensional position detecting element (PSD) 3. A PSD detection circuit 4 outputs a signal Po proportional to an amount of received light and signals (x-position signal S1 , y-position signal S2 ) proportional to a position (X coordinate, Y coordinate) of an image-formed point of the light L2 on the PSD 3. These signals Po, S1 , S2 are converted by an A/D-converter 5 and input to a microprocessor 6. Precietermined calculation is performed in the microprocessor 6, static characteristics stored in a memory system C in advance is compared with a measured value, and a parameter which is the closest to the measured value is selected. Thus a nature of an object to be measured can be automatically diagnosed from information on the amount of received light or information on scatter-reflectance.
申请公布号 JPH09196646(A) 申请公布日期 1997.07.31
申请号 JP19960009462 申请日期 1996.01.23
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 OGAWA SHIGEKI
分类号 G01B11/00;G01B11/30;G01C3/06;G01N21/88;G01N21/954;(IPC1-7):G01B11/30 主分类号 G01B11/00
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