发明名称 BASE RESIN FOR CHEMICAL AMPLIFICATION RESIST AND MANUFACTURE THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To provide the base resin, which has a large difference of solubility between before and after the exposure and which effectively forms a pattern at a high resolution, by forming each two (t)-butyl groups for restricting the dissolve in the specified parts. SOLUTION: This base resin is the polymer at 5000-200000 of weight mean molecular weight expressed with a formula. In the formula, R1 means (t)-butyl group or tetrahydropyranil group. R2 means hydrogen atom or methyl group, and m/(m+n)=0.1-0.9. The polymerization initiator is one selected among a group of azobisisobutyronitrile and benzoyl peroxide. The copolymer, which is manufactured at this stage, has a dissolution restricting group, which is not dissolved in the development liquid well. Since this copolymer is easy to be dissolved by the development liquid at the time of exposure in the acid catalyst atmosphere, in the case of using the chemical amplification resist, which is mainly composed of this copolymer, in a lithography, a pattern at a high resolution can be formed.</p>
申请公布号 JPH09197674(A) 申请公布日期 1997.07.31
申请号 JP19960184850 申请日期 1996.07.15
申请人 SAMSUNG ELECTRON CO LTD 发明人 SAI SOUSHIYUN;BOKU SHIYUNKON
分类号 G03F7/039;C08F4/04;C08F12/06;C08F12/08;C08F212/00;G03F7/032;(IPC1-7):G03F7/039 主分类号 G03F7/039
代理机构 代理人
主权项
地址