发明名称 SI SUBSTRATE FOR EPITAXIAL WAFER AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To produce an epitaxial wafer having a superior crystallinity without involving any dislocation in surface Si single crystal and no defect in view of the fine structure. SOLUTION: A Si substrate is heavily doped with Sb to provide a specified Sb concn. (Sbo ). Its surface Sb concn. (Sbs ) at its outermost face to grow an epitaxial film is 1×10<17> atoms/cm<3> or less and the Sb concn. increases at a gradient up to an Sb concn. (Sbx ) over (Sbo )×0.5 in the depth of at least 2 microns from the outermost face. The substrate can be produced by heat-treating its surface to grow the epitaxial film in a H -or/and Ar-containing gas atmosphere with (Sbs ) of at least 1×10<17> atoms/cm<3> or less.
申请公布号 JPH09199381(A) 申请公布日期 1997.07.31
申请号 JP19960022162 申请日期 1996.01.12
申请人 TOSHIBA CERAMICS CO LTD 发明人 SHIRAI HIROSHI;TAKEDA RYUJI;TSUON RII;HAYASHI TATEO;YOSHIKAWA ATSUSHI
分类号 C30B33/02;H01L21/02;H01L21/322;(IPC1-7):H01L21/02 主分类号 C30B33/02
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