发明名称 |
SI SUBSTRATE FOR EPITAXIAL WAFER AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To produce an epitaxial wafer having a superior crystallinity without involving any dislocation in surface Si single crystal and no defect in view of the fine structure. SOLUTION: A Si substrate is heavily doped with Sb to provide a specified Sb concn. (Sbo ). Its surface Sb concn. (Sbs ) at its outermost face to grow an epitaxial film is 1×10<17> atoms/cm<3> or less and the Sb concn. increases at a gradient up to an Sb concn. (Sbx ) over (Sbo )×0.5 in the depth of at least 2 microns from the outermost face. The substrate can be produced by heat-treating its surface to grow the epitaxial film in a H -or/and Ar-containing gas atmosphere with (Sbs ) of at least 1×10<17> atoms/cm<3> or less.
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申请公布号 |
JPH09199381(A) |
申请公布日期 |
1997.07.31 |
申请号 |
JP19960022162 |
申请日期 |
1996.01.12 |
申请人 |
TOSHIBA CERAMICS CO LTD |
发明人 |
SHIRAI HIROSHI;TAKEDA RYUJI;TSUON RII;HAYASHI TATEO;YOSHIKAWA ATSUSHI |
分类号 |
C30B33/02;H01L21/02;H01L21/322;(IPC1-7):H01L21/02 |
主分类号 |
C30B33/02 |
代理机构 |
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主权项 |
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地址 |
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