发明名称 XSENMASUKUKOZOTAINOSEIZOHOHO
摘要 <p>Proposed is a high-precision X-ray lithographic mask blank with reinforcement free from warping or distortion. The mask blank is an integral body comprising: (a) a frame made from a silicon wafer; (b) a membrane of an X-ray permeable material such as silicon carbide adhering to and supported by one surface of the frame; and (c) a reinforcing member made from a single crystal of silicon adhesively bonded to the other surface of the frame with (d) a layer of silicon oxide intervening between the frame and the reinforcing member. The mask blank can be prepared in a process of first forming a layer of silicon oxide on the surface of the silicon wafer and/or reinforcing member prior to deposition of the X-ray permeable film on the silicon wafer and heating them together at a temperature of 800 DEG C. or lower while they are in direct contact with each other with the silicon oxide layer intervening therebetween.</p>
申请公布号 JP2634714(B2) 申请公布日期 1997.07.30
申请号 JP19910219207 申请日期 1991.08.05
申请人 SHINETSU KAGAKU KOGYO KK 发明人 NOGUCHI HITOSHI;NAGATA AKIHIKO;KASHIDA SHU;KUBOTA YOSHIHIRO
分类号 G03F1/22;G03F7/20;G21K1/06;H01L21/027;(IPC1-7):H01L21/027;G03F1/16 主分类号 G03F1/22
代理机构 代理人
主权项
地址