发明名称 Vorrichtung zum Polieren von Halbleiterscheiben
摘要 There is disclosed a wafer-polishing apparatus suitably designed to carry out a chemical mechanical polishing operation. The apparatus includes a lower polishing plate assembly (100), a first rotating mechanism (125) for rotating the first polishing plate assembly (100), an upper polishing plate assembly (6), a second rotating mechanism (70,72) for rotating the upper polishing plate assembly (6), a pressing mechanism (68), a conveying mechanism (4) and a discharging mechanism (16). The lower polishing plate assembly (100) includes a lower polishing plate (102), a polishing pad (106), a porous sheet (104) interposed between the lower polishing plate (102) and the polishing pad (106). The porous sheet (104) has a thickness of 0.5 to 3 mm, and is formed of a foaming resin. The upper polishing plate assembly (6) includes an upper polishing plate (82), a plate-like chuck (84) and a backing pad (84B), a pressure reducing unit (PR), and a cleaning unit (c). <IMAGE>
申请公布号 DE69308482(T2) 申请公布日期 1997.07.31
申请号 DE1993608482T 申请日期 1993.08.10
申请人 MITSUBISHI MATERIALS CORP., TOKIO/TOKYO, JP;MITSUBISHI MATERIALS SILICON CORP., TOKIO/TOKYO, JP 发明人 TSUTSUMI, YUKIO, C/O MITSUBISHI MATERIALS, CHIYODA-KU, TOKYO, JP;KUMABE, SHIGEO, C/O MITSUBISHI MATERIALS, CHIYODA-KU, TOKYO, JP;TAKAHASHI, KEISUKE, C/O MITSUBISHI MATERIALS, CHIYODA-KU, TOKYO, JP
分类号 H01L21/304;B24B37/04;B24B37/30;(IPC1-7):B24B37/04 主分类号 H01L21/304
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