Built-in load board design for performing high resolution quiescent current measurements of a device under test

摘要

An improved load board design having a generic test circuit integrated into the load board capable of functioning with varying devices under test and requires little to no wiring. The test circuit is located in a fixed and optimal position of the load board with relation to the DUT. In a preferred embodiment, the test circuit is a quiescent test circuit for interfacing an integrated circuit tester to the DUT. The quiescent test circuit is capable of supplying high powered voltage to a DUT while the DUT's desired internal state is reached. At this point, the integrated circuit tester, sends an active select signal to the quiescent test circuit instantaneously deselecting the high-powered voltage supply to the DUT and selecting the integrated circuit tester's parametric measurement unit for powering the DUT. The integrated circuit tester, through a parametric measurement unit is capable of measuring the quiescent current of the DUT, while powering the DUT.