SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING THE SAME,申请号JP19960000532-传众专利搜索

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发明名称	SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING THE SAME
摘要
申请公布号	JPH09190790(A)	申请公布日期	1997.07.22
申请号	JP19960000532	申请日期	1996.01.08
申请人	JEOL LTD	发明人	ISHIMORI YOSHIO
分类号	H01J37/141;H01J37/28;(IPC1-7):H01J37/141	主分类号	H01J37/141
代理机构		代理人
主权项
地址

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