TEST GENERATION USING SIGNAL FLOW GRAPHS

摘要

The present invention relates to a method and apparatus for generating (18) test patterns to test (19) an analog or mixed signal circuit. A signal flow graph of the analog circuit is determined (12). The signal flow graph is inverted (14) and reverse simulated (16) with good and bad outputs to determine (17) component tolerances of the circuit given circuit output tolerances. The inverted signal flow graph is backtraced (16) from analog outputs to obtain analog input sinusoids which justify the analog outputs.