| 摘要 |
<p>An inexpensive test pattern generator with which block writing function test can be performed at a high speed. The test pattern generator is provided with a data register (41) which fetches and stores data signals from a data generating section (13) in accordance with a first write signal from a control signal generating section (15), an address selector (44) which fetches and stores specific bits from the address generated by an address generating section (12), a mask data register file (42) which fetches and stores mask data in a designated area in accordance with a second write signal from the control signal generating section (15), and a write data register file (43) which fetches and stores write data in a designated area in accordance with a third write signal from the control signal generating section (15) and a data formatter (60) which outputs the output data of the data register (41) or the output data of the data generating section (13) in accordance with each write signal.</p> |
