Probe for an optical near-field microscope

摘要

The sensor (1) consists of a one piece semiconductor (3) with a tapered porous end (4) through which can be excited by an electro-magnetic beam or an electric field to emit an electro-magnetic beam. The tapered end of the semiconductor can have a strip aperture enabling the electro-magnetic beam to be excited and to light up (7). The sensor material can be from the silicon, germanium, GaAs, SiC and Al2O3, group or the Quaternary group or from the 111-V-semiconductors.