发明名称 CHOONPAEIZOKENSASOCHI
摘要 PURPOSE:To obtain a proper measurement image and enable a defect, etc., to be judged easily without being affected by a surface state of an article to be inspected by fixing a position of a gate to a focusing position which is set in a surface-wave synchronization mode. CONSTITUTION:A mode-setting program 14a is set to a surface wave synchronization mode, a time value corresponding to a distance from a surface of an article 1 to be inspected to a focusing position is calculated by a CPU 9, it is sent to a peak-detection/distance-measuring portion 7 as a set delay time tDS, and at the same time it is stored in a data storage region 14e. Then, measurement start is input by a keyboard 10, a main synchronization mode is set, and a fixed grate setting program 14c is started. The CPU 9 calculates a sum of the time-measuring value tT from a transmission wave to the surface wave and the delay time tDS and then sends it to the distance-measuring; portion 7 as the set delay time TDS, thus enabling a crate pulse to be fixed at a position where a focus was located and hence a peak value and a position of a defect wave to be taken properly for obtaining an accurate measurement image.
申请公布号 JP2631783(B2) 申请公布日期 1997.07.16
申请号 JP19910205365 申请日期 1991.07.22
申请人 HITACHI KENKI KK 发明人 YANAGIMOTO HIROAKI
分类号 G01N29/06;G01N29/22;G01N29/38 主分类号 G01N29/06
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