发明名称 Method for fabricating a bipolar transistor with a base layer having an extremely low resistance
摘要 A base region structure involved in a bipolar transistor, wherein the base region comprises a compound semiconductor epitaxial layer formed in a recessed portion provided by etching in an upper region of the semiconductor substrate and the recessed portion has a depth corresponding to a thickness of the compound semiconductor epitaxial layer so that the base region has a top surface positioned at the same level as a top surface of the semiconductor substrate.
申请公布号 US5648280(A) 申请公布日期 1997.07.15
申请号 US19950533850 申请日期 1995.09.26
申请人 NEC CORPORATION 发明人 KATO, HIROSI
分类号 H01L29/73;H01L21/203;H01L21/318;H01L21/331;H01L29/165;H01L29/205;H01L29/732;H01L29/737;(IPC1-7):H01L21/265 主分类号 H01L29/73
代理机构 代理人
主权项
地址