发明名称 |
System having multiple subsystems and test signal source resident upon common substrate |
摘要 |
A system has multiple subsystems and a test signal source resident upon a common substrate. A first subsystem interfaces with an off-substrate functional tester during a test. The test signal source generates a first signal during the test for input to the second subsystem. The second subsystem responds performing an operation independent of operation and current state of the first subsystem. The functional tester verifies the independent operation of the first and second subsystems. |
申请公布号 |
US5648974(A) |
申请公布日期 |
1997.07.15 |
申请号 |
US19950572117 |
申请日期 |
1995.12.14 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
INGALLS, CHARLES L.;THOMANN, MARK R. |
分类号 |
G01R31/3185;G06F11/267;G06F11/27;G11C29/14;(IPC1-7):H04B15/00 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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