发明名称 |
Integrated circuit test socket having toggle clamp lid |
摘要 |
A test socket for integrated circuits includes a lid having a pressure pad which may move independently of the lid. The pressure pad is operated by a lever creating a large mechanical advantage and is provided to apply a large normal force to an integrated circuit in the test socket after the lid is closed to ensure good electrical contact between the integrated circuit device and the contact pins of the test socket.
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申请公布号 |
US5647756(A) |
申请公布日期 |
1997.07.15 |
申请号 |
US19950574770 |
申请日期 |
1995.12.19 |
申请人 |
MINNESOTA MINING AND MANUFACTURING |
发明人 |
TWIGG, RICHARD DEAN;MITCHEM, STEVEN DALE |
分类号 |
G01R1/04;(IPC1-7):H01R13/62 |
主分类号 |
G01R1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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