发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of detecting a signal path to a register generating failure. SOLUTION: Between a plurality of address control signal cables Y1 to Ym passing to an address control circuit 1 and a plurality of bit cables B1 to Bn passing to a bit control circuit 2, transfer gates T1 to Tmn for the address control signal cables passing based on the signals of the address control signal cables Y1 to Ym are provided, respectively. By way of the transfer gates T11 to Tmn, the inner gates I11 to Imn are connected to th bit cables B1 to Bmn. The inner gates I11 to In connect to the bit cables B1 to Bn by the connection of the transfer gases T11 to Tmn. To the bit cables B1 to Bn and the bit control circuit 2, the transfer gates Tx1 to Txn for bit cable are connected. The transfer gates Tx1 to Txn control connection by the b.t control signals from the bit control circuit 2 and output the signals of the bit cables B1 to Bn.
申请公布号 JPH09184872(A) 申请公布日期 1997.07.15
申请号 JP19950342967 申请日期 1995.12.28
申请人 NEC ENG LTD 发明人 KOBAYASHI TAMOTSU
分类号 G01R31/28;G06F11/22 主分类号 G01R31/28
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