SCANNING ELECTRON MICROSCOPE,申请号JP19950343830-传众专利搜索

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发明名称	SCANNING ELECTRON MICROSCOPE
摘要
申请公布号	JPH09185949(A)	申请公布日期	1997.07.15
申请号	JP19950343830	申请日期	1995.12.28
申请人	JEOL LTD	发明人	TAMURA NOBUAKI
分类号	H01J37/22;(IPC1-7):H01J37/22	主分类号	H01J37/22
代理机构		代理人
主权项
地址

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