发明名称 CONDUCTIVE STRUCTURE AND ITS FORMATION
摘要 PROBLEM TO BE SOLVED: To provide a conductive structure and its creating method for the interconnection wirings of integrated circuit chips. SOLUTION: A conductive structure comprises a bonding layer M18 made of Ti, Zr, Hf, V, Nb, Ta, W and the alloys thereof and a layer 20 made of Al-rare earth element alloy or Al-Y alloy. These layers can be united into one layer by a heat treatment. Further, adding a layer 22 made of AlCu, AlCuSi, or AlCuGe alloy to the conductive structure, the layer 22 and a layer present under the conductive structure can be formed into one layer by a heat treatment. By reducing the generation of MAl3 or other M aluminide, the problem of polishing these is overcome, and by reducing the size of polishing chip, the problem of generating scratches and the problem of performing a Cu-plating in the course of polishing are respectively overcome.
申请公布号 JPH09186238(A) 申请公布日期 1997.07.15
申请号 JP19960335409 申请日期 1996.12.16
申请人 INTERNATL BUSINESS MACH CORP (IBM) 发明人 MARIA RONEI
分类号 H01L21/285;H01L21/304;H01L21/3205;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L21/768;H01L21/320 主分类号 H01L21/285
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