| 摘要 |
A mask ROM having a test circuit is disclosed. The mask ROM comprises an input portion receiving an external control signal, a control portion generating a control signal for controlling an actual chip operation in response to the external control signal, a sense amplifier amplifying the data stored in a cell, an output portion outputting a signal amplified in the sense amplifier to outside in response to the control signal of the control portion, an input/output portion outputting data when using the actual chip and inputting external data during a testing, a first latch portion storing external data from the input/output pad in response to the control signal of the control portion, a second latch portion storing data output from the sense amplifier in response to the control signal of the control portion, a comparison portion comparing signals output from the first and second latch portions, and a judgement portion judging that the mask ROM is passed or failed according to the comparing result of the comparison portion. Thus, it is possible to easily test the internal circuit of the mask ROM.
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