发明名称 |
APPARATUS AND METHOD FOR MEASURING AN ION CURRENT |
摘要 |
Disclosed is a method and apparatus to test ion current of magnetic field type. By the method, a magnet(11) is installed at inlet of a faraday cup(10) to form a magnetic field. An earth electrode plate(13) on which ion beam incidence hole is formed is installed at outside of the inlet of faraday cup(10). A current meter(12) is connected to the faraday cup(10) so that ion current is measured with pressing the secondary electrons by the magnetic field. Thereby, the apparatus is able to be simplified and integrated, and the accuracy of measuring value is improved.
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申请公布号 |
KR970011715(B1) |
申请公布日期 |
1997.07.14 |
申请号 |
KR19940032560 |
申请日期 |
1994.12.02 |
申请人 |
SAMSUNG ELECTRONICS CO.,LTD |
发明人 |
SONG, YOUNG-JIN;CHOE, BYUNG-HO |
分类号 |
G01R19/00;(IPC1-7):G01R19/00 |
主分类号 |
G01R19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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