| 摘要 |
<p>A magnetooptical recording medium wherein a multilayered thin-film structure is optimized to control optical phase difference of the medium in order to maintain a high S/N ratio. This structure is obtained by stacking on a transparent substrate at least a first protective film of a thickness of 400 to 700 ANGSTROM , a recording film of a thickness of 150 to 300 ANGSTROM , a second protective film of a thickness of 150 to 250 ANGSTROM , and a reflective film of a thickness of 400 to 800 ANGSTROM . Each of the first and second protective layers is suitable one composed of AlSiN, SiN or SiO2 having a refractive index of 1.95 to 2.05. The recording layer is suitably one composed of NdxDyy(FeCo)100-x.y or Ndx(DyTb)y(FezCo1-x)100-x.y and satisfying the following relationship: 25 at % </= x + y </= 30 at %, 0 at % </= x </= 8 at %, 0.07 at % </= z </= 0.43 at %.</p> |
