发明名称 METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To control the temperature of a semiconductor substrate with high precision, during plasma-processing the semiconductor substrate. SOLUTION: A semiconductor substrate W is put on a sample stage 3 provided with a cooling means 9 and a heating means 8, and the semiconductor substrate W is processed by generating a plasma P, adjusting the temperature of the sample stage 3 by the cooling means 9 and the heating means 8 and adjusting the temperature of the semiconductor substrate W. The degree of heating by the heating means 8 is lowered by an amount set beforehand when the plasma P is generated, and the degree of heating is returned to its original value at the end of the generation of the plasma P.</p>
申请公布号 JPH09172053(A) 申请公布日期 1997.06.30
申请号 JP19960019772 申请日期 1996.02.06
申请人 SONY CORP 发明人 HIRANO SHINSUKE;SHIROSAKI TOMOHIDE;HATTORI TADASHI;KADOMURA SHINGO
分类号 C23C16/50;C23C16/52;H01L21/203;H01L21/205;H01L21/285;H01L21/302;H01L21/3065;H01L21/68;H01L21/683;(IPC1-7):H01L21/68;H01L21/306 主分类号 C23C16/50
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