| 摘要 |
PROBLEM TO BE SOLVED: To obtain an analysis apparatus in which a measuring error due to an apparatus drift can be reduced to the minimum and by which a change in a medium in a solution to be analyzed or the existence of a gas phase can be detected by using a reference element which does not exist inside the solution. SOLUTION: The apparatus is composed of exciting and analytical means 12, 14 which excite a solution by means of exciting X-rays and which analyze spectral X-rays emitted from the excited solution, solution acceptance means 4, 8, 20 which have a transparent region 18 with reference to the excited X-rays, the spectral X-rays and reference X-rays, and a reference element 6. The reference element 6 is the reference element 6 which is situated at the outside with reference to the solution, it is integrated with the acceptance means 4, 8, 10, and it is arranged so as to face region 18 in such a way that the solution exists between the region 18 and the reference element 6. It can emit reference X-rays which are different from the spectral X-rays when an exciting radiation is received, it analyzes the reference X-rays and the spectral X-rays, and it can correct a measuring drift which is easy to generate during the analysis of the solution. |
