| 摘要 |
The invention concerns a sampling method and a sampling circuit, where two sampling devices 100 and 110 are used and where the first sampling device 100 takes a sample from the measurement object 106 and the second sampling device 110 takes a sample at the output 102 of the first sampling device 100. The output 112 of the second sampling device 110 is functionally fed back to the holding section 104 of the first sampling device 100, wherein the holding time is determined by the holding section of both sampling devices 100 and 110. In a preferred embodiment, the first sampling device 100 is fast and the second sampling device 110 is slow. With this solution, one advantageously achieves both a fast sampling and a long holding. <IMAGE>
|
