发明名称 |
Electrooptic probe for measuring voltage of an object having a high permittivity film fixed on an end face of a reflecting film fixed on an electrooptic material |
摘要 |
An electrooptic probe for measuring voltage of an object without contact with the object. The electrooptic probe according to the present invention includes an electro-optic material having a refractive index to light that varies in accordance with an electric field, a conductive reflecting film for reflecting an incident beam transmitted through the electro-optic material, fixed to an end face of the electro-optic material facing the object to be measured, a transparent electrode fixed on the other end face of the electro-optic material, and a high permittivity film fixed on an end face of the reflecting film facing the object to be measured.
|
申请公布号 |
US5642040(A) |
申请公布日期 |
1997.06.24 |
申请号 |
US19950547449 |
申请日期 |
1995.10.24 |
申请人 |
HAMAMATSU PHOTONICS K.K. |
发明人 |
TAKAHASHI, HIRONORI;WAKAMORI, KAZUHIKO |
分类号 |
G01R1/067;G01R1/07;G01R19/00;(IPC1-7):G01R23/16 |
主分类号 |
G01R1/067 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|