THIN FILM PHASE TRANSFORMATION MEASURING METHOD AND MEASURING DEVICE,申请号JP19950324265-传众专利搜索

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发明名称	THIN FILM PHASE TRANSFORMATION MEASURING METHOD AND MEASURING DEVICE
摘要
申请公布号	JPH09166561(A)	申请公布日期	1997.06.24
申请号	JP19950324265	申请日期	1995.12.13
申请人	NEC CORP	发明人	OSHIMA NORIKAZU
分类号	G01N25/02;G01N21/27;G01N27/04;(IPC1-7):G01N25/02	主分类号	G01N25/02
代理机构		代理人
主权项
地址

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