发明名称 PHOTOMASK AND METHOD FOR FORMING THE SAME
摘要 PROBLEM TO BE SOLVED: To accurately form a resolution chart and also to restrain the defect of circuit operation by performing patterning by reversing a first pattern unrelated to the circuit operation with a second pattern related to the circuit operation. SOLUTION: As to the circuit pattern 1 of the photomask 3A; a light shielding film 10A remains on the pattern part, and the film 10A is removed at the back ground part and a transparent board 10B is exposed. As to the resolution chart pattern 2A on the photomask 3A; the pattern inside a reversing area P is reversed with the pattern arranged at the area other than the reversing area P so as to perform patterning. That is, at least the part or all of a specified pattern unrelated to the circuit operation is reversed with the circuit pattern 1 related to the circuit operation so as to perform patterning. Consequently, the specified pattern can be accurately formed and also the defect of the circuit operation can be restrained.
申请公布号 JPH09160217(A) 申请公布日期 1997.06.20
申请号 JP19950320026 申请日期 1995.12.08
申请人 NIKON CORP 发明人 MATSUDA HIDEAKI
分类号 G03F1/44;G03F1/68;H01L21/027 主分类号 G03F1/44
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