发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 A method of fabricating a semiconductor device includes the steps of forming a polysilicon layer and refractory metal silicide layer on a lower structure formed on a semiconductor substrate, dry-etching the polysilicon layer and refractory metal silicide layer to form a polysilicon layer pattern and refractory silicide layer pattern, and performing heat treatment to remove by-products generated during the dry etching process.
申请公布号 KR970009974(B1) 申请公布日期 1997.06.19
申请号 KR19930032280 申请日期 1993.12.31
申请人 SAMSUNG ELECTRONICS CO.,LTD 发明人 LEE, RAE-INN;PARK, MOON-HAN;KIM, YOUNG-WOOK;OH, KWAN-YOUNG
分类号 H01L21/302;H01L21/304;H01L21/3065;H01L21/3205;(IPC1-7):H01L21/304 主分类号 H01L21/302
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