发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
A method of fabricating a semiconductor device includes the steps of forming a polysilicon layer and refractory metal silicide layer on a lower structure formed on a semiconductor substrate, dry-etching the polysilicon layer and refractory metal silicide layer to form a polysilicon layer pattern and refractory silicide layer pattern, and performing heat treatment to remove by-products generated during the dry etching process.
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申请公布号 |
KR970009974(B1) |
申请公布日期 |
1997.06.19 |
申请号 |
KR19930032280 |
申请日期 |
1993.12.31 |
申请人 |
SAMSUNG ELECTRONICS CO.,LTD |
发明人 |
LEE, RAE-INN;PARK, MOON-HAN;KIM, YOUNG-WOOK;OH, KWAN-YOUNG |
分类号 |
H01L21/302;H01L21/304;H01L21/3065;H01L21/3205;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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