Method for forming arrangement measuring pattern of contact hole by using photo mask for forming the hole,申请号KR1019940001900-传众专利搜索

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发明名称	Method for forming arrangement measuring pattern of contact hole by using photo mask for forming the hole
摘要
申请公布号	KR1019970009973(B1)	申请公布日期	1997.06.19
申请号	KR1019940001900	申请日期	1994.02.02
申请人		发明人
分类号		主分类号
代理机构		代理人
主权项
地址

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