发明名称 Correlated double scanner with several sample=and=hold circuit units
摘要 The sample-and-hold circuit units (8,14) scan a wide signal delivered from an image sensor system (2). They then transmit a preset DC voltage level signal. A circuit (60) clamps the video signal and engages the sample-and-hold circuit units. The scanner comprises a differential amplifier (18). There are several repeat scanning-hold circuit units (12,30,32) for repeated scanning of signals from the first units. A level correction stage (26,28) processor the units signals and transmits a signal with phase synchronised with repeat unit output signal. Scanning noise is removed by specified units (36,38).
申请公布号 DE19650384(A1) 申请公布日期 1997.06.19
申请号 DE19961050384 申请日期 1996.12.05
申请人 SAMSUNG ELECTRONICS CO., LTD., SUWON, KR 发明人 KWON, HYEOK-CHUL, PUCHEON, KR
分类号 G11C27/02;H04N5/30;H04N5/335;H04N5/357;H04N5/363;H04N5/372;H04N5/378;(IPC1-7):H04N3/14;H04N1/409 主分类号 G11C27/02
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