| 摘要 |
A communication circuit fault detector tests a communication circuit by using a sequence generator to generate a test signal, a memory circuit to temporarily store the test signal, and a multiplexer to multiplex the test signal and an input data signal into the communication circuit. A timing generator drives the communication circuit at a rate higher than the normal communication rate, enabling the data signal and test signal to be sent through the communication circuit simultaneously. A demultiplexer demultiplexes the output signal from the communication circuit into an output data signal and a returned test signal. A comparator compares the returned test signal with the test signal stored in the memory circuit and generates a result signal indicating whether they match.
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