发明名称 METHOD AND APPARATUS FOR PROGRAMMABLE MEMORY CONTROL WITH ERROR REGULATION AND TEST FUNCTIONS
摘要 An electronic circuit (10) for controlling and testing up to eight banks (12) of RAMs (14l - 14n) includes a controller portion (20) for controlling accessing of the RAM banks to permit read and write operations to be carried out, and for initiating testing of the RAMs as well. The circuit (10) also includes a data path portion (22) for detecting parity errors in the data written to and read from the RAMs as well as for detecting errors which occur during testing initiated by thecontrol portion. An interface portion (24) may also be provided to allow test commands, status information and error data to be communicated to and from the circuit (10) across a four-wire boundary scan bus.
申请公布号 CA2074750(C) 申请公布日期 1997.06.17
申请号 CA19922074750 申请日期 1992.07.28
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 RAGHAVACHARI, PARTHA
分类号 G06F12/16;G06F11/10;G06F11/22;G06F12/06;G11C29/10;G11C29/16;(IPC1-7):G06F13/16;G06F12/02;G01R31/26 主分类号 G06F12/16
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