发明名称 STRUCTURAL ANALYZER, IN PARTICULAR FOR MEDICAL IMPLANTS
摘要 A dental analyzer for analyzing dental implants includes a dental probe having a probe tip for contacting a patient's dental implant. An accelerometer is coupled to the probe tip. A hammer fired by an actuator against the accelerometer impacts the probe tip against the dental implant which vibrates the dental implant. The accelerometer measures the acceleration time history of the vibrating dental implant. A processor converts the measured acceleration time history of the dental implant into a frequency spectrum from which a diagnosis can then be made regarding the condition of the dental implant.
申请公布号 EP0777439(A1) 申请公布日期 1997.06.11
申请号 EP19950930913 申请日期 1995.08.23
申请人 SPECTRAL SCIENCES RESEARCH CORPORATION 发明人 CUCCHIARO, PAUL, J.;DELUZIO, ANTHONY;DARIO, LAWRENCE, J.;CUCCHIARO, STEPHEN, J.
分类号 A61B5/00;A61B5/11;A61C8/00;A61C19/04;(IPC1-7):A61B5/11 主分类号 A61B5/00
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