发明名称 |
SEMICONDUCTOR DEVICE AND IC CHIP INSPECTING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To facilitate inspecting an IC chip and packaging good products after inspection by electrically connecting the chip to a circuit board having circuits on the surface of an insulating film through an anisotropic conductive film contg. conductive particles dispersed in an insulating adhesive agent resin. SOLUTION: An anisotropic conductive film contg. conductive particles dispersed in an insulating adhesive agent resin is pressed or hot pressed to electrically connect electrodes 10 of an IC chip 1 to an electrode circuit 6 of a circuit board 9 whereby the quality judgment of the chip can easily be made, using electrode terminals of the board 9. If the chip 1 is non-defective after inspection thereof, an adhesive agent resin 4 of the film 2 is hardened at a higher temp. and high pressure and then the chip 1 can be readily mounted on the board 9.</p> |
申请公布号 |
JPH09153516(A) |
申请公布日期 |
1997.06.10 |
申请号 |
JP19950311793 |
申请日期 |
1995.11.30 |
申请人 |
SUMITOMO BAKELITE CO LTD |
发明人 |
KAWADA MASAKAZU;TANAKA JUNJI |
分类号 |
G01R31/26;H01L21/321;H01L21/60;H01L21/66;(IPC1-7):H01L21/60 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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