发明名称 SEMICONDUCTOR DEVICE AND IC CHIP INSPECTING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To facilitate inspecting an IC chip and packaging good products after inspection by electrically connecting the chip to a circuit board having circuits on the surface of an insulating film through an anisotropic conductive film contg. conductive particles dispersed in an insulating adhesive agent resin. SOLUTION: An anisotropic conductive film contg. conductive particles dispersed in an insulating adhesive agent resin is pressed or hot pressed to electrically connect electrodes 10 of an IC chip 1 to an electrode circuit 6 of a circuit board 9 whereby the quality judgment of the chip can easily be made, using electrode terminals of the board 9. If the chip 1 is non-defective after inspection thereof, an adhesive agent resin 4 of the film 2 is hardened at a higher temp. and high pressure and then the chip 1 can be readily mounted on the board 9.</p>
申请公布号 JPH09153516(A) 申请公布日期 1997.06.10
申请号 JP19950311793 申请日期 1995.11.30
申请人 SUMITOMO BAKELITE CO LTD 发明人 KAWADA MASAKAZU;TANAKA JUNJI
分类号 G01R31/26;H01L21/321;H01L21/60;H01L21/66;(IPC1-7):H01L21/60 主分类号 G01R31/26
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