发明名称 SURFACE QUALITY INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To reduce the parts number such as an image pickup element, etc., by compressing an image of the surface of a to-be-inspected material in a single direction for imaging with an optical technique, so that high inspection precision is kept. SOLUTION: When the inspection with high precision especially in a single direction of a two-dimensional image is required, the image is compressed in a single direction far imaging as follows. The surface of a slab 2, acting as a to-be-inspected material, is irradiated with slit light from a light source 1. After the reflected light is converged through a lens 3, through an image compressing means 4, such as a convex mirror, etc., optically compressing the image in only a single direction, height or width, the rectangular image with large height/width ratio on the to-be-inspected material is imaged on a square or a rectangular two-dimensional image pickup element 5 with small height/width ratio. The image obtained in this way is analyzed with an image processing device 6, for inspecting quality of the surface of to-be-inspected material. So that, while high precise inspection is performed, the numbers of the image pickup element 5 and the image processing device 6 are reduced, and reduction of the east of equipment and improvement of maintenance characteristic are possible.
申请公布号 JPH09152319(A) 申请公布日期 1997.06.10
申请号 JP19950334235 申请日期 1995.11.30
申请人 NIPPON STEEL CORP 发明人 YAMAMOTO KAZUO;HATANO TOSHIKAZU
分类号 G01B11/24;B21C51/00;B22D11/16;G01B11/30;G01N21/89;G01N21/892;G06T1/00;G06T7/00 主分类号 G01B11/24
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