发明名称 DEVICE FOR IRRADIATING RANGE OF MICRON UNIT AND/OR SUBMICRONUNIT IN PHOTOSENSITIVE LAYER AND METHOD OF FORMING PATTERN IN SUCH LAYER
摘要 <p>PROBLEM TO BE SOLVED: To provide an apparatus to irradiate beam to a range in micron scale of a photosensitive layer and provide a method for formation of a pattern of such a layer. SOLUTION: This method involves the processes of exposing a resin layer 120 to the atmosphere containing a liquid which does not have high wettability to a photosensitive material to form a single layer 121 of fine dews on the resin layer 120; irradiating beam to the photosensitive material layer through the single layer 121 of droplets to selectively print exposed regions 122 of the resin layer; removing the single layer 121 of droplets; and developing the photosensitive material layer to form a pattern which is conformed to the exposed regions.</p>
申请公布号 JPH09153329(A) 申请公布日期 1997.06.10
申请号 JP19960216497 申请日期 1996.08.16
申请人 COMMISS ENERG ATOM 发明人 MITSUSHIERU IIDA;ROBEERU BATEISUTO
分类号 G03B7/20;G03F7/20;H01J9/02;H01L21/027;(IPC1-7):H01J9/02 主分类号 G03B7/20
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