发明名称 RESIST DEVELOPING METHOD
摘要 PROBLEM TO BE SOLVED: To automatically obtaine an accurate BTT(Break-Through Time) so as to realize the proper control of TDT(Total Development Time) in a resist developing process. SOLUTION: Waveform data written in a waveform memory 21 are repeatedly read out in an intermediate time period between an estimated BTT and a TDT, and a BTT is obtained through a BTT operation part 29 applying arithmetic algorithms A (i) to ideal waveform data with no noise and pseudo- waveform data varied in noise level, and the average value and the maximum deviation of a BTT related to data read out many times from the wave form memory 21 are obtained for each noise level concerning pseudo-waveform data varied in noise level. Algorism where the deviation is smaller than a threshold value and the average value is closest to a BTT which is obtained by applying the same algorism to ideal waveform data is selected out, and a BTT is obtained by applying the algorism to the final read-out data of waveform.
申请公布号 JPH09153450(A) 申请公布日期 1997.06.10
申请号 JP19950332492 申请日期 1995.11.29
申请人 VICTOR CO OF JAPAN LTD 发明人 YOKOCHI YOSHINARI
分类号 G03F7/30;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/30
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