发明名称 |
Latch-up verification device |
摘要 |
A latch-up verification device including a latch-up verifying portion (3) which automatically performs a latch-up verification upon a layout pattern specified by layout pattern data (D1) by using transistor information (D4) with back gate terminal information given from the layout pattern data (D1) as a function of connection between a source terminal of respective transistors having the same back gate terminal information and a well region including the transistors, whereby the automatic latch-up verification with a constant accuracy is performed upon a layout pattern of CMOS structure with greatly increased efficiency.
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申请公布号 |
US5638286(A) |
申请公布日期 |
1997.06.10 |
申请号 |
US19930052602 |
申请日期 |
1993.04.27 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
FUJIMOTO, YUTAKA |
分类号 |
H01L21/82;G06F17/50;H01L27/08;(IPC1-7):G06F17/50 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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