发明名称 Hierarchical DRAM array with grouped I/O lines and high speed sensing circuit
摘要 A random access memory array architecture including a plurality of arrays or subarrays arranged into rows and columns, a plurality of sense amplifiers between the arrays (2), and grouped input/output (I/O) lines. The I/O path includes main I/O lines (24) coupled to all of the arrays, with orthogonal local I/O lines (20) for a column of arrays plus sub I/O lines (16) orthogonal to the local I/O lines for each group of sense amplifiers in a row of sense amplifiers. A plurality of pass transistor pairs and interconnect transistors are coupled to the sense amplifiers and the local and sub I/O lines. Latches are provided for storing data output from each of the subarrays, and a match comparator is connected to at least two of the latches for providing a signal on a complementary pair of match leads indicative of a comparison of the data in the latches. A true lead of the complementary pair of match leads is precharged high before the comparison while a complement lead of the complementary pair of match leads is precharged low.
申请公布号 US5638317(A) 申请公布日期 1997.06.10
申请号 US19940222507 申请日期 1994.04.04
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 TRAN, HIEP V.
分类号 G11C11/409;G11C7/10;G11C11/401;G11C11/4091;G11C11/4096;G11C29/00;G11C29/34;(IPC1-7):G11C5/06;G11C5/02;G11C7/00;G11C11/40 主分类号 G11C11/409
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