发明名称 REWRITING FREQUENCY MEASURING INSTRUMENT FOR NONVOLATILE MEMORY
摘要 PROBLEM TO BE SOLVED: To eliminate the need for a dedicated measuring instrument by accessing a specific address of a 2nd nonvolatile memory when a one-chip microcomputer is initialized. SOLUTION: When the one-chip microcomputer is initialized, a flag 18 is reset to '0' with an initial signal TNT and the chip-enable terminal CE of a mask ROM 2 is held at '0' to place the mask ROM 2 in a readable state. When the contents of an accumulator 10 are not '00'H, the flag 18 is set with the logical output of an arithmetic logic unit 13. Then, an EEPROM (1st nonvolatile memory) 1 is enabled and the mask ROM (2nd nonvolatile memory) 2 is disabled. Further, when data in the EEPROM 1 are rewritten, a switching control signal becomes '1' according to a program instruction in the mask ROM 2 to enable both the mask ROM 2 and EEPROM 1.
申请公布号 JPH09146912(A) 申请公布日期 1997.06.06
申请号 JP19950307653 申请日期 1995.11.27
申请人 SANYO ELECTRIC CO LTD 发明人 OSAWA HIROSHI
分类号 G06F12/16;G06F11/22;G06F15/78;G11C16/02;G11C16/06;G11C17/00;G11C29/00;G11C29/04 主分类号 G06F12/16
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