发明名称 |
Testing method for efficient testing of micro-controllers |
摘要 |
A micro-controller 12 is operable in three test modes selectable by a register 42 and multiplexer 32 in response to a mode switching signal from a test instrument 28. In an "outer" mode, external instructions from the test instrument are executed in a circuit 30 and the results are sent back to the test instrument. In an "inner" mode, instructions of an in-built self-test program stored in a memory 36 are executed. In the third mode, a ROM read-out device 40 is used for reading the contents of an application program memory 34 so that they can be checked. Provision of the "outer" mode allows up-dating of test procedures. |
申请公布号 |
DE19545156(A1) |
申请公布日期 |
1997.06.05 |
申请号 |
DE1995145156 |
申请日期 |
1995.12.04 |
申请人 |
HOLTEK MICROELECTRONICS INC., HSINCHU, TW |
发明人 |
FANG, I LIANG, HSINCHU, TW;YU, KUO CHENG, HSINCHU, TW |
分类号 |
G06F11/267;G06F11/273;G11C29/52;(IPC1-7):G01R31/26;G01R31/317;G01R31/00 |
主分类号 |
G06F11/267 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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