发明名称 Testing method for efficient testing of micro-controllers
摘要 A micro-controller 12 is operable in three test modes selectable by a register 42 and multiplexer 32 in response to a mode switching signal from a test instrument 28. In an "outer" mode, external instructions from the test instrument are executed in a circuit 30 and the results are sent back to the test instrument. In an "inner" mode, instructions of an in-built self-test program stored in a memory 36 are executed. In the third mode, a ROM read-out device 40 is used for reading the contents of an application program memory 34 so that they can be checked. Provision of the "outer" mode allows up-dating of test procedures.
申请公布号 DE19545156(A1) 申请公布日期 1997.06.05
申请号 DE1995145156 申请日期 1995.12.04
申请人 HOLTEK MICROELECTRONICS INC., HSINCHU, TW 发明人 FANG, I LIANG, HSINCHU, TW;YU, KUO CHENG, HSINCHU, TW
分类号 G06F11/267;G06F11/273;G11C29/52;(IPC1-7):G01R31/26;G01R31/317;G01R31/00 主分类号 G06F11/267
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