Test pattern generating apparatus

摘要

A test pattern generating apparatus for generating test patterns for testing a sequential circuit having at least one memory element includes an analog logic value calculator for calculating, in response to an primary input applied to the sequential circuit, an analog logic values of the signal lines in the sequential circuit by a nonlinear function, a data quantity calculator for storing a history data of the analog logic values of the signal lines with an inverse covariance matrix of the analog logic values, and an evaluation value calculator for calculating an evaluation value according to a degree of variance between the analog logic values and the history data. An primary input setting unit is provided for producing a next primary input which can provide a maximum evaluation value from the evaluation value obtained from the present primary input. A memory sequentially stores the primary inputs produced by the primary input setting means.