发明名称 |
MOS transistor and fabrication process therefor |
摘要 |
<p>An MOS transistor comprises a semiconductor substrate having a field region; a gate electrode formed on the semiconductor substrate through the intermediatry of a gate insulating film; and source/drain regions formed in the semiconductor substrate; wherein the field region including at least a lower insulating film and an upper insulating film made of a material permitting the upper insulating film to be selectively etched with respect to the lower insulating film; the gate electrode being configured such that the gate length of a top surface thereof is greater than the gate length of a bottom surface thereof facing a channel region positioned between the source/drain regions; the gate electrode having a sidewall spacer formed of a sidewall insulating layer made of the lower insulating film and a material permitting the sidewall insulating layer to be selectively etched with respect to the upper insulating film, the sidewall spacer contacting a side wall of the gate electrode for covering an outer periphery of the channel region; and the channel region being substantially leveled with the source/drain regions. <IMAGE> <IMAGE></p> |
申请公布号 |
EP0777269(A2) |
申请公布日期 |
1997.06.04 |
申请号 |
EP19960305957 |
申请日期 |
1996.08.15 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
IGUCHI, KATSUJI;AZUMA, KENICHI;KAWAMURA, AKIO |
分类号 |
H01L29/78;H01L21/265;H01L21/28;H01L21/336;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/423;(IPC1-7):H01L21/823 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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