发明名称 Base developable negative photoresist and use thereof
摘要 <p>A composition containing novolak polymer, and/or poly(p-vinylphenol), an organometallic material, an amino polymer a cationic photocatalyst. The composition can also include a cosensitizer material which makes a composition sensitive to near U.V. radiation.</p>
申请公布号 EP0534204(B1) 申请公布日期 1997.06.04
申请号 EP19920115167 申请日期 1992.09.04
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BABICH, EDWARD D.;GALLIGAN, EILEEN A.;GELORME, JEFFREY D.;MCGOUEY, RICHARD P.;NUNES, SHARON L.;PARASZCZAK, JURIJ R.;SERINO, RUSSELL J.;WITMAN, DAVID F.
分类号 G03F7/004;G03F7/029;G03F7/038;G03F7/075;H01L21/027;H01L21/30;(IPC1-7):G03F7/038 主分类号 G03F7/004
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